Diffraction microscopy using 20 kV electron beam for multiwallcarbon nanotubes

• Published in: Applied physics letters Vol. 92; no. 2; pp. 024106 - 024106-3
• Main Authors: Kamimura, Osamu, Kawahara, Kota, Doi, Takahisa, Dobashi, Takashi, Abe, Takashi, Gohara, Kazutoshi
• Format: Journal Article
• Published: American Institute of Physics 15-01-2008
• ISSN: 0003-6951; 1077-3118
• DOI: 10.1063/1.2834372

Diffraction microscopy with iterative phase retrieval using a
20
kV
electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of
0.34
nm
.