Intermediate valence to Kondo behaviour in [MathML equation]

Measurements of X-ray diffraction (XRD), resistivity ([rho](T)), magnetic susceptibility ([chi](T)) and magnetization ([sigma](k(0)H)) are reported for the polycrystalline Ce(Pt(1-x)Ir(x))(2)Si(2) alloy system. The unit cell volume derived from the XRD results deviates from Vegards rule around x=0.2...

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Bibliographic Details
Published in:Physica. B, Condensed matter Vol. 404; no. 19; pp. 2992 - 2994
Main Authors: Tchokonte, M.B. Tchoula, Du Plessis, P. de V., Kaczorowski, D
Format: Journal Article
Language:English
Published: 15-10-2009
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Summary:Measurements of X-ray diffraction (XRD), resistivity ([rho](T)), magnetic susceptibility ([chi](T)) and magnetization ([sigma](k(0)H)) are reported for the polycrystalline Ce(Pt(1-x)Ir(x))(2)Si(2) alloy system. The unit cell volume derived from the XRD results deviates from Vegards rule around x=0.2-0.3. [chi](T) measurements show a Curie-Weiss behaviour at high temperatures for the x= 0, 0.1 and 0.2 alloys whereas the alloys with x > =0.4 exhibit broad maxima in [chi](T) at intermediate temperature (e.g. at 170 K for x=0.4). The latter behaviour due to valence fluctuations as described by Sales and Wohlleben. [rho](T) data indicate Kondo lattice behaviour for x < =0.2 and fluctuating valency for x > =0.3. [sigma](k(0)H) data indicate metamagnetic behaviour for the x=0.4 alloy.
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ISSN:0921-4526
DOI:10.1016/j.physb.2009.07.015