New self-aligned recessed-gate InP MESFET
The authors describe a new self-aligned recessed-gate InP MESFET. In this structure, material selective and anisotropic etching properties of InP/InGaAsP system are utilized to alleviate the difficulties associated with channel recess and gate alignment. Using this technique a 1- mu m A1-gate InP ME...
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Published in: | IEEE transactions on electron devices Vol. ED-3; no. 6; pp. 840 - 841 |
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Main Authors: | , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
01-01-1984
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Online Access: | Get full text |
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Summary: | The authors describe a new self-aligned recessed-gate InP MESFET. In this structure, material selective and anisotropic etching properties of InP/InGaAsP system are utilized to alleviate the difficulties associated with channel recess and gate alignment. Using this technique a 1- mu m A1-gate InP MESFET with a transconductance similar to 110 mS/mm is demonstrated. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 content type line 23 ObjectType-Feature-1 |
ISSN: | 0018-9383 |