Resolving Bulk and Grain Boundary Transport Properties of TiO sub(2) Thin Films Enabled by Laser-Induced Anisotropic Morphology

Precise deconvolution of grain and grain boundary contributions to the overall impedance of TiO sub(2) thin films is achieved by impedance spectroscopy measurements of textured films with elongated grains obtained by laser-induced melting and sequential lateral solidification. The ability to enginee...

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Bibliographic Details
Published in:Advanced materials (Weinheim) Vol. 23; no. 29; pp. 3266 - 3271
Main Authors: Ankonina, Guy, Chung, Ui-Jin, Chitu, Adrian M, Komem, Yigal, Rothschild, Avner
Format: Journal Article
Language:English
Published: 01-08-2011
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Summary:Precise deconvolution of grain and grain boundary contributions to the overall impedance of TiO sub(2) thin films is achieved by impedance spectroscopy measurements of textured films with elongated grains obtained by laser-induced melting and sequential lateral solidification. The ability to engineer the grain morphology of electroceramic films provides opportunities for new designs of ferroelectric memories, piezoelectric microsensors and microactuators, optical waveguides, and other devices.
Bibliography:ObjectType-Article-1
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ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201100917