Synthesis and characterization of Ba^sub 0.7^Sr^sub 0.3^TiO3, BaZr^sub 0.3^Ti^sub 0.7^O3 thin film heterostructures

• Published in: Journal of materials science. Materials in electronics Vol. 23; no. 2; p. 557
• Main Authors: Tarale, A N, Jigajeni, S R, Salunkhe, D J, Joshi, P B, Kulkarni, S B, Phase, D M, Chaudhary, R J, Deshapande, S K
• Format: Journal Article
• Language: English
• Published: New York Springer Nature B.V 01-02-2012
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-011-0436-4

The paper presents synthesis of Ba^sub 0.7^Sr^sub 0.3^TiO3 (BST), Ba^sub 0.7^Sr^sub 0.3^TiO3 (BZT) thin films and BZT/BST heterostructures using modified Pechini method. The La^sub 0.7^Sr^sub 0.3^MnO3 has been used as a conducting bottom layer to form metal ferroelectric metal capacitor. The thin films are spin coated on SiO2/n-Si (100) substrates. The thin films thus deposited are characterized for crystal structure, morphology, dielectric and complex impedance properties. The results show that BZT/BST heterostructures show reduced loss tangent tan δ and useful value of figure of merit γ in RF range of frequencies. The results on dielectric properties could be analyzed in terms of the Maxwell-Wagner Model and contribution due to superlattice effects.[PUBLICATION ABSTRACT]