Analytical, optical and electrophysical investigations of TiBx-GaAs interface

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Bibliographic Details
Published in:	Surface science Vol. 482-85; pp. 928 - 934
Main Authors:	DMITRUK, N. L, ERMOLOVICH, I. B, FURSENKO, O. V, KONAKOVA, R. V, MILENIN, V. V, VOITSIKHOVSKYI, D. I, YASTRUBCHAK, O. B
Format:	Conference Proceeding
Language:	English
Published:	Amsterdam Elsevier Science 2001 New York, NY Lausanne
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Iii-v semiconductors Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics Gallium arsenides Titanium borides Spectroscopic ellipsometry Schottky barriers Semiconductor-metal boundaries Photoluminescence Transition elements Compounds Solid-solid interfaces Experimental study AES
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ISSN:	0039-6028 1879-2758