Stabilization of scandium rich spinel ferrite CoFe{sub 2−x}Sc{sub x}O{sub 4} (x≤1) in thin films

• Published in: Journal of solid state chemistry Vol. 232
• Main Authors: Lefevre, Christophe, Roulland, François, Thomasson, Alexandre, Autissier, Emmanuel, Leuvrey, Cédric, Barre, Sophie, Versini, Gilles, Viart, Nathalie, Pourroy, Geneviève
• Format: Journal Article
• Language: English
• Published: United States 15-12-2015
• Subjects: COBALT; COBALT OXIDES; CRYSTAL DEFECTS; DEPOSITS; ENERGY BEAM DEPOSITION; EPITAXY; FERRITE; FERRITES; INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; LASER RADIATION; LASERS; MAGNESIUM OXIDES; PULSED IRRADIATION; PULSES; SCANDIUM; SPINELS; STABILIZATION; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
• ISSN: 0022-4596; 1095-726X
• DOI: 10.1016/J.JSSC.2015.09.012

Scandium rich cobalt ferrites Co{sub y}Fe{sub 3−x−y}Sc{sub x}O{sub 4} with y~1 never obtained in bulk could be stabilized in pulsed laser deposited thin films. Scandium contents of up to x=1 are reached. The cell parameter increases versus x as awaited when considering the size of scandium. It is equal to 0.8620 nm for x=1, significantly higher than that of CoFe{sub 2}O{sub 4} (0.8396 nm). The lattice mismatch between the MgO (100) substrate and the scandium-containing spinel leads to an increased roughness. Cobalt is displaced from the octahedral site by Sc and mainly occupies the tetrahedral sites for high x values. - Graphical abstract: Magnification of the XRD patterns recorded on thin films of CoFe{sub 2-x}Sc{sub x}O{sub 4} for x=0, 0.45, 1 and 1.2, the arrows denote the (004) and (008) diffraction lines of the spinel phase.