InAs Nanocrystals with Robust p-Type Doping

Robust control over the carrier type is fundamental for the fabrication of nanocrystal-based optoelectronic devices, such as the p–n homojunction, but effective incorporation of impurities in semiconductor nanocrystals and its characterization is highly challenging due to their small size. In this w...

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Bibliographic Details
Published in:Advanced functional materials Vol. 31; no. 6
Main Authors: Asor, Lior, Liu, Jing, Ossia, Yonatan, Tripathi, Durgesh C., Tessler, Nir, Frenkel, Anatoly I., Banin, Uri
Format: Journal Article
Language:English
Published: United States Wiley 03-11-2020
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Summary:Robust control over the carrier type is fundamental for the fabrication of nanocrystal-based optoelectronic devices, such as the p–n homojunction, but effective incorporation of impurities in semiconductor nanocrystals and its characterization is highly challenging due to their small size. In this work, InAs nanocrystals, post-synthetically doped with Cd, serve as a model system for successful p-type doping of originally n-type InAs nanocrystals, as demonstrated in field effect transistors (FETs). Advanced structural analysis, using atomic resolution electron microscopy and synchrotron X-ray absorption fine structure spectroscopy reveal that Cd impurities reside near and on the nanocrystal surface acting as substitutional p-dopants replacing Indium. Commensurately, Cd-doped InAs FETs exhibit remarkable stability of their hole conduction, mobility, and hysteretic behavior over time when exposed to air, while intrinsic InAs NCs FETs are easily oxidized and their performance quickly declined. Therefore, Cd plays a dual role acting as a p-type dopant, and also protects the nanocrystals from oxidation, as evidenced directly by X-ray photoelectron spectroscopy measurements of air exposed samples of intrinsic and Cd-doped InAs NCs films. This study demonstrates robust p-type doping of InAs nanocrystals, setting the stage for implementation of such doped nanocrystal systems in printed electronic devices.
Bibliography:USDOE Office of Science (SC), Basic Energy Sciences (BES)
Israel Science Foundation
SC0012573; SC0012704; 1867/17; 488/16
ISSN:1616-301X
1616-3028