Correlated high-resolution x-ray diffraction, photoluminescence, and atom probe tomography analysis of continuous and discontinuous Inx Ga1-x N quantum wells

Correlated high-resolution x-ray diffraction, photoluminescence, and atom probe tomography analysis of continuous and discontinuous Inx Ga1-x N quantum wells

Saved in:
Bibliographic Details
Published in:Applied physics letters Vol. 107; no. 2
Main Authors: Ren, Xiaochen, Riley, James R., Koleske, Daniel D., Lauhon, Lincoln J.
Format: Journal Article
Language:English
Published: United States American Institute of Physics (AIP) 13-07-2015
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Bibliography:USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
AC04-94AL85000
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4926808