Pressure dependence of secondary NIR scintillation

• Published in: 2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149) Vol. 1; pp. 5/145 - 5/149 vol.1
• Main Authors: Fraga, M.M.R., Bueno, C.C., Goncalves, J.A.C., Fraga, F.A.F., Ferreira Marques, R., Policarpo, A.J.P.L.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2000
• Subjects: Argon; Atomic measurements; Charge coupled devices; Charge measurement; Current measurement; Electron emission; Gain measurement; Optical imaging; Performance evaluation; Solid scintillation detectors
• ISBN: 9780780365032; 0780365038
• ISSN: 1082-3654; 2577-0829
• DOI: 10.1109/NSSMIC.2000.949102

The variation with the charge gain of the total number of photons emitted per electron, in the visible and NIR regions (0.4</spl lambda/<1 /spl mu/m), in Ar/CF/sub 4/ mixtures, is investigated for CF/sub 4/ concentrations below 15%. Measurements are performed in a uniform field configuration and results are presented for charge gains below 100, under X-ray excitation. The spectral distribution of the emitted light in Ar/CF/sub 4/ mixtures is also analyzed. The pressure dependence (1-5 atm) of the secondary light output, in the visible and near infrared regions (NIR) is studied as a function of the reduced electric field E/P for pure argon and argon-tetrafluoromethane mixtures. Above charge multiplication threshold, the number of NIR photons decreases with increasing pressure.