Clustering based evaluation of I/sub DDQ/ measurements: applications in testing and classification of ICs

• Published in: Proceedings 18th IEEE VLSI Test Symposium pp. 444 - 449
• Main Authors: Jandhyala, S., Balachandran, H., Sengupta, M., Jayasumana, A.P.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2000
• Subjects: Application software; Failure analysis; Gas detectors; Instruments; Integrated circuit testing; Manufacturing; Packaging; Process design; Production; Read only memory
• ISBN: 9780769506135; 0769506135
• ISSN: 1093-0167; 2375-1053
• DOI: 10.1109/VTEST.2000.843877

Effectiveness of the clustering based approach in detecting devices with abnormal I/sub DDQ/ values is evaluated using data from the SEMATECH test methods experiment. The results from clustering are compared to the results obtained on actual silicon during the SEMATECH study. The differences between the results obtained in each case are analyzed. The clustering approach is also compared to two common I/sub DDQ/ test techniques, the single-threshold approach and the delta-I/sub DDQ/ approach, and the results are presented.