Characterization of dielectric materials using partially loaded waveguide measurements

• Published in: 2012 The 7th German Microwave Conference pp. 1 - 3
• Main Authors: Kilic, E., Siart, U., Schmidt, C. H., Eibert, T. F.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01-03-2012
• Subjects: dielectric loaded waveguide; Electromagnetic waveguides; Material characterization; Materials; Permittivity; Permittivity measurement; Temperature measurement; Transmission line measurements
• ISBN: 1457720965; 9781457720963
• ISSN: 2167-8022; 2167-8030

In this study, an iterative inversion algorithm for the determination of complex dielectric permittivity of non-magnetic, isotropic materials is presented. The dielectric sample to be measured is considered to load a rectangular waveguide partially. The inversion method is based on a fit between simulated and measured scattering parameters by Newton's technique. In order to obtain the simulated scattering parameters, a 3-D electromagnetic field solver is used to perform full-wave simulation of the problem under consideration. For validation of the proposed technique, estimated complex dielectric permittivities of three different materials at K-band are presented.