Temperature dependency and dielectric properties of EPDM with void

• Published in: Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials Vol. 2; pp. 972 - 975 vol.2
• Main Authors: Dong-Shick Kim, Moo-Seong Kang, Jae-Hyung Oh, Chang-Hun Lee, Dae-Hee Park, Yong-Joo Kim
• Format: Conference Proceeding
• Language: English
• Published: IEEE 1997
• Subjects: Aging; Cable insulation; Capacitance; Dielectrics and electrical insulation; Electrodes; Paramagnetic resonance; Rubber; Temperature dependence; Temperature distribution; Voltage
• ISBN: 0780326512; 9780780326514
• DOI: 10.1109/ICPADM.1997.616606

The dielectric characteristics of EPDM were characterized and the temperature dependency was also evaluated at the constant electric field. While the value of tan /spl delta/ was 3.55/spl times/10/sup -3/(%) and increased with increasing temperature in EPDM without voids, the value of tan /spl delta/ was lowered to 2.24/spl times/10/sup -3/(%) and the temperature influence on tan /spl delta/ was not shown to be great in the EPDM containing voids. It was shown that the dielectric properties of EPDM was the most influencing factor on the properties of EPDM/semiconductor specimen but the semiconductor layer played only a simple role as an electrode in the specimen.