Scanning nonlinear dielectric microscope for investigation of polarization distributions
This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants.
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Published in: | ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics Vol. 1; pp. 355 - 358 vol.1 |
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Main Authors: | , |
Format: | Conference Proceeding |
Language: | English |
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1996
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Abstract | This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants. |
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AbstractList | This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants. |
Author | Kirihara, A. Cho, Y. |
Author_xml | – sequence: 1 givenname: Y. surname: Cho fullname: Cho, Y. organization: Dept. of Electr. Eng., Yamaguchi Univ., Ube, Japan – sequence: 2 givenname: A. surname: Kirihara fullname: Kirihara, A. |
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PublicationTitle | ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics |
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PublicationYear | 1996 |
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Snippet | This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic... |
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StartPage | 355 |
SubjectTerms | Capacitance Dielectric constant Dielectric measurements Dielectric thin films Electric variables measurement Ferroelectric materials Frequency Optical resonators Polarization Scanning electron microscopy |
Title | Scanning nonlinear dielectric microscope for investigation of polarization distributions |
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