Scanning nonlinear dielectric microscope for investigation of polarization distributions

This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants.

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Published in:ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics Vol. 1; pp. 355 - 358 vol.1
Main Authors: Cho, Y., Kirihara, A.
Format: Conference Proceeding
Language:English
Published: IEEE 1996
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Abstract This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants.
AbstractList This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants.
Author Kirihara, A.
Cho, Y.
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PublicationTitle ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics
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Snippet This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic...
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StartPage 355
SubjectTerms Capacitance
Dielectric constant
Dielectric measurements
Dielectric thin films
Electric variables measurement
Ferroelectric materials
Frequency
Optical resonators
Polarization
Scanning electron microscopy
Title Scanning nonlinear dielectric microscope for investigation of polarization distributions
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