Scanning nonlinear dielectric microscope for investigation of polarization distributions

Scanning nonlinear dielectric microscope for investigation of polarization distributions

This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants.

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Bibliographic Details
Published in:ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics Vol. 1; pp. 355 - 358 vol.1
Main Authors: Cho, Y., Kirihara, A.
Format: Conference Proceeding
Language:English
Published: IEEE 1996
Subjects:
Capacitance
Dielectric constant
Dielectric measurements
Dielectric thin films
Electric variables measurement
Ferroelectric materials
Frequency
Optical resonators
Polarization
Scanning electron microscopy
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Description
Summary:This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants.
ISBN:9780780333550
0780333551
DOI:10.1109/ISAF.1996.602766