A low leakage low cost-PMOS based power supply clamp with active feedback for ESD protection in 65nm CMOS technologies

A low leakage low cost-PMOS based power supply clamp with active feedback for ESD protection in 65nm CMOS technologies

A novel PMOS based power supply protection clamp is presented which is designed to operate in a state-of-the art 65 nm, low leakage CMOS process. The design is shown to be amenable to the inherent challenges posed by low cost I/O transistors. Robust ESD and electrical operation is shown as well as i...

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Bibliographic Details
Published in:2005 Electrical Overstress/Electrostatic Discharge Symposium pp. 1 - 9
Main Authors: Smith, J.C., Cline, R.A., Boselli, G.
Format: Conference Proceeding
Language:English
Published: IEEE 01-09-2005
Subjects:
Clamps
CMOS process
CMOS technology
Costs
Electrostatic discharge
Feedback
Power supplies
Process design
Protection
Online Access:Get full text
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Summary:A novel PMOS based power supply protection clamp is presented which is designed to operate in a state-of-the art 65 nm, low leakage CMOS process. The design is shown to be amenable to the inherent challenges posed by low cost I/O transistors. Robust ESD and electrical operation is shown as well as immunity to transient latch-up.