The use of a test specification format in automatic test program generation

The use of a test specification format in automatic test program generation

Test specifications formats (TSFs) to facilitate standardization of testing information on ICs and circuit boards are examined. The author describes the application areas of a TSF and shows the practical use of one particular TSF, the neutral code format (NCF) proposed by C. Mortensen (1987). By wri...

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Bibliographic Details
Published in:[1989] Proceedings of the 1st European Test Conference pp. 362 - 368
Main Author: Verhelst, B.
Format: Conference Proceeding
Language:English
Published: IEEE Comput. Soc. Press 1989
Subjects:
Automatic testing
Circuit testing
Digital integrated circuits
Electronic equipment testing
Integrated circuit testing
Laboratories
Performance evaluation
Printed circuits
Software packages
Software testing
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Summary:Test specifications formats (TSFs) to facilitate standardization of testing information on ICs and circuit boards are examined. The author describes the application areas of a TSF and shows the practical use of one particular TSF, the neutral code format (NCF) proposed by C. Mortensen (1987). By writing a translator from NCF to a test programming language, it was seen that automatic test program generation is possible. It is found, however, that only GO/NOGO test programs could be generated.< >
ISBN:0818619376
9780818619373
DOI:10.1109/ETC.1989.36264