Broadband characterization of optoelectronic components to 65 GHz using VNA techniques

• Published in: Conference, 2003. Fall 2003. 62nd ARFTG Microwave Measurements pp. 53 - 59
• Main Authors: Albrecht, T., Martens, J., Clement, T.S., Hale, P.D., Williams, D.F.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2003
• Subjects: Calibration; Distributed feedback devices; Earth Observing System; High speed optical techniques; Measurement standards; NIST; Optical mixing; Optical receivers; Photodiodes; Sampling methods
• ISBN: 0780381955; 9780780381957
• DOI: 10.1109/ARFTGF.2003.1459752

This paper discusses the typical uncertainties associated with characterizing high-speed photodiodes to 65 GHz when using a vector network analyzer (VNA) measurement technique. We analyzed the accuracy of the technique by comparing measurements of two reference standards that had previously been calibrated using electro-optic sampling (EOS) and heterodyne methods. The results of the comparison show very good correlation to the direct characterizations. Typical uncertainties were less than 1.0 dB at frequencies up to 50 GHz and less than 2 dB at 65 GHz. The dominant sources of uncertainty come from the noise floor in the VNA above 50 GHz (depending upon signal level) and the base uncertainty in the reference-standard calibration.