Detailed investigation of geometrical factor for pseudo-MOS technique

Detailed investigation of geometrical factor for pseudo-MOS technique

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Bibliographic Details
Published in:IEEE transactions on electron devices Vol. 52, n°3; pp. 406 - 413
Main Author: Komiya N. Bresson S. Sato S. Cristoloveanu Y. Omura, K.
Format: Journal Article
Language:English
Published: Institute of Electrical and Electronics Engineers 2005
Subjects:
Engineering Sciences
Micro and nanotechnologies
Microelectronics
Online Access:Get full text
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ISSN:0018-9383