Direct probing of semiconductor barium titanate via electrostatic force microscopy Sondagem direta de titanato de bário semicondutorpor meio de microscopia de força eletrostática

Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage...

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Bibliographic Details

Published in:	Cerâmica (São Paulo) Vol. 53; no. 326; pp. 200 - 204
Main Authors:	S. M. Gheno, H. L. Hasegawa, P. I. Paulin Filho
Format:	Magazine Article
Language:	English
Published:	Associação Brasileira de Cerâmica 01-06-2007
Subjects:	barium titanate barreiras barriers electric potential electrostatic force microscopy microscopia de força eletrostática potencial elétrico titanato de bário
Online Access:	Get full text
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