REPEATED TESTING DOES NOT AFFECT VARIABILITY AND RELIABILITY IN SHORT WAVELENGTH AUTOMATED PERIMETRY (SWAP): Poster # 83 (OD-306)

REPEATED TESTING DOES NOT AFFECT VARIABILITY AND RELIABILITY IN SHORT WAVELENGTH AUTOMATED PERIMETRY (SWAP) Poster # 83 (OD-306)

Saved in:
Bibliographic Details
Published in:Optometry and vision science Vol. 72; no. SUPPLEMENT; p. 232
Main Authors: Kelly, Susan A., Trachimowicz, Ruth A., Lee, David Y., Chaglasian, Michael A.
Format: Journal Article
Language:English
Published: 01-12-1995
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
ISSN:1040-5488
DOI:10.1097/00006324-199512001-00382