Precision tests of third-generation four-quark operators: matching SMEFT to LEFT

We present the one- and two-loop matching between the Standard Model effective field theory (SMEFT) and the low-energy effective field theory (LEFT), focusing on the contributions of third-generation four-quark operators that impact electroweak precision measurements and flavour physics observables....

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Bibliographic Details
Main Authors: Haisch, Ulrich, Schnell, Luc
Format: Journal Article
Language:English
Published: 17-10-2024
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Summary:We present the one- and two-loop matching between the Standard Model effective field theory (SMEFT) and the low-energy effective field theory (LEFT), focusing on the contributions of third-generation four-quark operators that impact electroweak precision measurements and flavour physics observables. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.
Bibliography:MPP-2024-198
DOI:10.48550/arxiv.2410.13304