Quadratic Statistical [Formula Omitted] Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits

In this paper, we propose an efficient numerical algorithm for estimating the parametric yield of analog/RF circuits, considering large-scale process variations.

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems Vol. 27; no. 5; p. 831
Main Authors: Xin Li, Xin Li, Yaping Zhan, Yaping Zhan, Pileggi, L.T
Format: Journal Article
Language:English
Published: New York The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01-05-2008
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Description
Summary:In this paper, we propose an efficient numerical algorithm for estimating the parametric yield of analog/RF circuits, considering large-scale process variations.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2008.917582