Quadratic Statistical [Formula Omitted] Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits
In this paper, we propose an efficient numerical algorithm for estimating the parametric yield of analog/RF circuits, considering large-scale process variations.
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Published in: | IEEE transactions on computer-aided design of integrated circuits and systems Vol. 27; no. 5; p. 831 |
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Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
01-05-2008
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Subjects: | |
Online Access: | Get full text |
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Summary: | In this paper, we propose an efficient numerical algorithm for estimating the parametric yield of analog/RF circuits, considering large-scale process variations. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0278-0070 1937-4151 |
DOI: | 10.1109/TCAD.2008.917582 |