Growth of thick AlxGa1-xN ternary alloy by hydride vapor-phase epitaxy
Growth of thick AlxGa1-xN ternary alloy using AlCl3 and GaCl gases as group III precursors was performed by hydride vapor-phase epitaxy (HVPE). C-axis-oriented AlGaN layers could be grown at 1100 deg C. It was found that the growth of AlxGa1-xN by HVPE was affected by the presence of H2 in the carri...
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Published in: | Journal of crystal growth Vol. 300; no. 1; pp. 164 - 167 |
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Main Authors: | , , , , |
Format: | Conference Proceeding Journal Article |
Language: | English |
Published: |
Amsterdam
Elsevier
01-03-2007
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Subjects: | |
Online Access: | Get full text |
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Summary: | Growth of thick AlxGa1-xN ternary alloy using AlCl3 and GaCl gases as group III precursors was performed by hydride vapor-phase epitaxy (HVPE). C-axis-oriented AlGaN layers could be grown at 1100 deg C. It was found that the growth of AlxGa1-xN by HVPE was affected by the presence of H2 in the carrier gas. Therefore, the solid composition x in AlxGa1-xN ternary alloy could be controlled by changing the input Al mole ratio of the group III precursor (RAl) and/or the low range ( < 10%) of partial pressure of hydrogen (H2) in the carrier gas (Fo). The growth rate of approximately 30mum/h was obtained under inert carrier gas (Fo=0.0), while the growth rate decreased rapidly in the low RAl under a low partial pressure of H2 in the carrier gas (Fo=0.1). These results are in good agreement with the thermodynamic prospect. Thus, the growth of AlxGa1-xN using HVPE is thermodynamically controlled. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2006.11.009 |