Growth of thick AlxGa1-xN ternary alloy by hydride vapor-phase epitaxy

Growth of thick AlxGa1-xN ternary alloy using AlCl3 and GaCl gases as group III precursors was performed by hydride vapor-phase epitaxy (HVPE). C-axis-oriented AlGaN layers could be grown at 1100 deg C. It was found that the growth of AlxGa1-xN by HVPE was affected by the presence of H2 in the carri...

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Published in:Journal of crystal growth Vol. 300; no. 1; pp. 164 - 167
Main Authors: YAMANE, Takayoshi, SATOH, Fumitaka, MURAKAMI, Hisashi, KUMAGAI, Yoshinao, KOUKITU, Akinori
Format: Conference Proceeding Journal Article
Language:English
Published: Amsterdam Elsevier 01-03-2007
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Summary:Growth of thick AlxGa1-xN ternary alloy using AlCl3 and GaCl gases as group III precursors was performed by hydride vapor-phase epitaxy (HVPE). C-axis-oriented AlGaN layers could be grown at 1100 deg C. It was found that the growth of AlxGa1-xN by HVPE was affected by the presence of H2 in the carrier gas. Therefore, the solid composition x in AlxGa1-xN ternary alloy could be controlled by changing the input Al mole ratio of the group III precursor (RAl) and/or the low range ( < 10%) of partial pressure of hydrogen (H2) in the carrier gas (Fo). The growth rate of approximately 30mum/h was obtained under inert carrier gas (Fo=0.0), while the growth rate decreased rapidly in the low RAl under a low partial pressure of H2 in the carrier gas (Fo=0.1). These results are in good agreement with the thermodynamic prospect. Thus, the growth of AlxGa1-xN using HVPE is thermodynamically controlled.
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content type line 23
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2006.11.009