EFFECT OF 8 MeV ELECTRON IRRADIATION ON ELECTRICAL PROPERTIES OF CuInSe2 THIN FILMS
Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe2 thin films have been investigated. The n-type CuInSe2 films in which the carrier concentration was about 3x1016 cm-3, were epitaxially grown on a GaAs(001) substrate by RF diode sputtering. No significant change...
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| Published in: | Solar energy materials and solar cells Vol. 75; no. 1-2; pp. 115 - 120 |
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| Main Authors: | , , , , , , |
| Format: | Journal Article |
| Language: | English |
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01-01-2003
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| Abstract | Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe2 thin films have been investigated. The n-type CuInSe2 films in which the carrier concentration was about 3x1016 cm-3, were epitaxially grown on a GaAs(001) substrate by RF diode sputtering. No significant change in the electrical properties was observed under the electron fluence < 3x1016 ecm-2. As the electron fluence exceeded 1017 ecm-2, both the carrier concentration and Hall mobility slightly decreased. The carrier removal rate was estimated to be about 0.8 cm-1, which is lower than that of III-V compound materials. 14 refs. |
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| AbstractList | Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe2 thin films have been investigated. The n-type CuInSe2 films in which the carrier concentration was about 3x1016 cm-3, were epitaxially grown on a GaAs(001) substrate by RF diode sputtering. No significant change in the electrical properties was observed under the electron fluence < 3x1016 ecm-2. As the electron fluence exceeded 1017 ecm-2, both the carrier concentration and Hall mobility slightly decreased. The carrier removal rate was estimated to be about 0.8 cm-1, which is lower than that of III-V compound materials. 14 refs. |
| Author | Tanaka, T Matsuda, Y Yoshida, A Taniguchi, R Fujishiro, M Yamaguchi, T Wakahara, A |
| Author_xml | – sequence: 1 givenname: T surname: Tanaka fullname: Tanaka, T – sequence: 2 givenname: T surname: Yamaguchi fullname: Yamaguchi, T – sequence: 3 givenname: A surname: Wakahara fullname: Wakahara, A – sequence: 4 givenname: A surname: Yoshida fullname: Yoshida, A – sequence: 5 givenname: R surname: Taniguchi fullname: Taniguchi, R – sequence: 6 givenname: Y surname: Matsuda fullname: Matsuda, Y – sequence: 7 givenname: M surname: Fujishiro fullname: Fujishiro, M |
| BookMark | eNo9jN9LwzAcxPMwwW36Jwh5En2oJt9k-fFYausC3Tra6uto0wSU2k6z_v9uTISDu_vA3QLNhnFwCN1R8kQJFc8V0SAjAlw9EHgkhFIZ8Rma_-NrtAjhkxACgvE5qtIsS5MaFxlWeOPecZqfallssSnL-MXEtTnlky7cJHGOd2WxS8vapNV5lkxmqBzgem22ODP5prpBV77pg7v98yV6y9I6WUd58Xo-iA5U8WPUrry0WsqOtSA7oaRqPFBmqbdUU0WtsM5L3lLlOyc0EZZpYh0ArCQIrdkS3V9-Dz_j9-TCcf_1Eazr-2Zw4xT2IJUQnDH2C3ShTAs |
| ContentType | Journal Article |
| DBID | 7QQ 8FD JG9 |
| DOI | 10.1016/S0927-0248(02)00117-4 |
| DatabaseName | Ceramic Abstracts Technology Research Database Materials Research Database |
| DatabaseTitle | Materials Research Database Technology Research Database Ceramic Abstracts |
| DatabaseTitleList | Materials Research Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EndPage | 120 |
| GroupedDBID | --K --M .~1 0R~ 123 1B1 1~. 4.4 457 4G. 5VS 71M 7QQ 8FD 8P~ 9JN AABNK AABXZ AACTN AAEDT AAEDW AAEPC AAHCO AAIKJ AAKOC AALRI AAOAW AAQFI AARJD AARLI AAXKI AAXUO ABFNM ABMAC ABNUV ABXDB ABXRA ACDAQ ACGFS ACIWK ACNNM ACRLP ADBBV ADECG ADEWK ADEZE ADMUD AEKER AENEX AEZYN AFKWA AFRAH AFRZQ AFTJW AFZHZ AGHFR AGUBO AGYEJ AHHHB AHIDL AHPOS AIEXJ AIKHN AITUG AJOXV AJSZI AKRWK AKURH ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ AXJTR BELTK BKOJK BLXMC CS3 DU5 EBS EFJIC ENUVR EO8 EO9 EP2 EP3 FDB FIRID FLBIZ FNPLU FYGXN G-Q HZ~ IHE J1W JARJE JG9 KOM LY6 LY7 M24 M41 MAGPM MO0 N9A O-L O9- OAUVE OZT P-9 PC. Q38 RIG RNS ROL RPZ SCB SDF SDG SDP SES SPC SPCBC SPD SSG SSK SSM SSR SSZ T5K TWZ WH7 XPP ZMT ~02 ~G- |
| ID | FETCH-LOGICAL-p184t-b5f7c977d3b27d6878af213c1fc19181c6cef74b18fde6906c390ce2225726993 |
| ISSN | 0927-0248 |
| IngestDate | Fri Oct 25 01:35:04 EDT 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 1-2 |
| Language | English |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-p184t-b5f7c977d3b27d6878af213c1fc19181c6cef74b18fde6906c390ce2225726993 |
| Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| PQID | 27866433 |
| PQPubID | 23500 |
| PageCount | 6 |
| ParticipantIDs | proquest_miscellaneous_27866433 |
| PublicationCentury | 2000 |
| PublicationDate | 20030101 |
| PublicationDateYYYYMMDD | 2003-01-01 |
| PublicationDate_xml | – month: 01 year: 2003 text: 20030101 day: 01 |
| PublicationDecade | 2000 |
| PublicationTitle | Solar energy materials and solar cells |
| PublicationYear | 2003 |
| SSID | ssj0002634 |
| Score | 1.8127514 |
| Snippet | Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe2 thin films have been investigated. The n-type CuInSe2 films in which... |
| SourceID | proquest |
| SourceType | Aggregation Database |
| StartPage | 115 |
| Title | EFFECT OF 8 MeV ELECTRON IRRADIATION ON ELECTRICAL PROPERTIES OF CuInSe2 THIN FILMS |
| URI | https://search.proquest.com/docview/27866433 |
| Volume | 75 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV3Nb9MwFLfYdoHDxAYINhg-cABFEYmTxc6x6lI1U2lRm0F3qhx_AJuWIrr-_zzHzke1A3BAiqLkxXGUvJ-ef3557xmhd4TyINZB6ZeSaTNBifw0jZWvWQrDb1Kmoq7TPV7Q6ZJdZHHW_cHvZP9V0yADXZvM2X_QdtspCOAYdA570Drs_0rvQDyzYWGCeZj3SX3xsgmczmdTL5_PBxe5XWUHNiuvqyF8NsF88wKIobltuM2rhSJeMc6n3iifOK_1TZPOa8JWlc0YBLZrX8mz7ndzyfwJaHl6wSt-y3disa_5Hf9mVmDZkX6FZqZ09I539Xq9-f5D9mSNdyLqeSecm5FQ39RN61tcu1ZKgyyX_mgNaGiTO91YHNaJcg_NvPU4LNrOgYybQrJpXeHOZQ3tlNaezlajq8lkVWTLYg8dELBKYBQPBnm2vGwHbpLUQQhtr13C18fuUe8D8sE95sHwXXOS4ik6dJMJPLAoOEKPVHWMnvRKTD5DC4sHPBthhgEPuMED7uEBw9bhAXd4MLc5PGCDB1zj4Tm6GmXFcOy7hTT8nzCBv_fLc00FEH0ZlYTKhFHGNQkjEWoB03UWikQoTeMyZFoqU7laRGkglHEFUJIAg32B9qt1pV4iTEshI2jJQ8FjLUsOBDw4B5EEthXE0Sv0tvkmKzBUBnO8UuvtZkUoS4D-Rid_bHGKHndQeo32739t1Ru0t5HbM6ey3_O6SjI |
| link.rule.ids | 315,782,786,27933,27934 |
| linkProvider | Elsevier |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=EFFECT+OF+8+MeV+ELECTRON+IRRADIATION+ON+ELECTRICAL+PROPERTIES+OF+CuInSe2+THIN+FILMS&rft.jtitle=Solar+energy+materials+and+solar+cells&rft.au=Tanaka%2C+T&rft.au=Yamaguchi%2C+T&rft.au=Wakahara%2C+A&rft.au=Yoshida%2C+A&rft.date=2003-01-01&rft.issn=0927-0248&rft.volume=75&rft.issue=1-2&rft.spage=115&rft.epage=120&rft_id=info:doi/10.1016%2FS0927-0248%2802%2900117-4&rft.externalDBID=NO_FULL_TEXT |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0927-0248&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0927-0248&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0927-0248&client=summon |