Results of X-band electronically scanned array using an overlapped subarray architecture

• Published in: 2010 IEEE International Symposium on Phased Array Systems and Technology pp. 713 - 718
• Main Authors: Duffy, Sean M, Willwerth, Francis, Retherford, Larry, Herd, Jeffrey S
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01-10-2010
• Subjects: Arrays; Attenuators; Connectors; Microstrip; Microstrip antennas; Phase shifters; Tiles
• ISBN: 9781424451272; 1424451272
• DOI: 10.1109/ARRAY.2010.5613285

The measured results from an X-band electronically scanned array using an overlapped subarray architecture are presented. The 2D architecture uses a 12×12 element subarray with 3 to 1 overlapping. The active electronic scanned array is a receive only implementation consisting of switch, low noise amplifier, phase shifter and attenuator. Measured far-field patterns and excitation at the aperture using near-field scanner demonstrates desired design goals of a 20 degree sector beam with low sidelobes. Finally, the scan performance of the sector subarray beam is measured at 20 and 40 degrees. A three tile implementation is constructed and measured.