Application of moment and Fourier descriptors to the accurate estimation of elliptical shape parameters

• Published in: [Proceedings] ICASSP 91: 1991 International Conference on Acoustics, Speech, and Signal Processing pp. 2465 - 2468 vol.4
• Main Authors: Safaee-Rad, R., Smith, K.C., Benhabib, B., Tchoukanov, I.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 1991
• Subjects: Application software; Computer integrated manufacturing; Dentistry; Educational institutions; Image analysis; Laboratories; Mathematics; Mechanical engineering; Parameter estimation; Shape
• ISBN: 9780780300033; 0780300033
• ISSN: 1520-6149; 2379-190X
• DOI: 10.1109/ICASSP.1991.150900

The problem of accurate parameter estimation of elliptical shapes is addressed. Three methods based on elliptical Fourier descriptors, area moments, and perimeter moments of 2-D elliptical shapes are presented. The mathematics of these methods is discussed and, for area moments, a set of new formulas based on Gauss's theorem is given. To implement a comparative performance study, a method developed by R. Safaee-Rad et al. (1990), the weighted minimum-square-error (MSE) function, is included, and an objective and independent measure of goodness of fit is used. The performance of these methods is compared for two different cases, that of a perfect simulated ellipse and an imperfect imaged ellipse.< >