Skin relaxation predicts neural firing rate adaptation in SAI touch receptors
In response to ramp-and-hold indentation, the slowly-adapting type I (SAI) afferent exhibits an exponential decrease in its firing frequency during the hold phase. Such adaptation may be tied to skin relaxation but is neither well understood nor has it been quantitatively modeled. The specific hypot...
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Published in: | 2010 Annual International Conference of the IEEE Engineering in Medicine and Biology Vol. 2010; pp. 6678 - 6681 |
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Main Authors: | , , , , |
Format: | Conference Proceeding Journal Article |
Language: | English |
Published: |
United States
IEEE
01-01-2010
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Subjects: | |
Online Access: | Get full text |
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Summary: | In response to ramp-and-hold indentation, the slowly-adapting type I (SAI) afferent exhibits an exponential decrease in its firing frequency during the hold phase. Such adaptation may be tied to skin relaxation but is neither well understood nor has it been quantitatively modeled. The specific hypothesis of this work is that skin relaxation is a primary contributor to observed changes in firing rate. Double exponential functions were fit to 21 responses from a mouse SAI afferent for both instantaneous firing rate and indenter tip force over time. The model was then generalized by using a linear transformation between fit parameters for force and firing rate data, allowing prediction of firing rates from force. The results show that the generalized model matches the recorded firing rate (R 2 = 0.65) equally well as fitting a double-exponential function directly to firing rate (R 2 = 0.67) for a second dataset. When the procedure was repeated with two D-hair fibers, the generalized model matched the recorded firing rate (R 2 = 0.47) much more poorly compared to the fitted double-exponential function (R 2 = 0.89). Thus, firing rate adaptation in SAI responses can be predicted by skin relaxation, whereas this factor alone did not adequately describe adaptation in the D-hair. |
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ISBN: | 1424441234 9781424441235 |
ISSN: | 1094-687X 1557-170X 1558-4615 |
DOI: | 10.1109/IEMBS.2010.5626264 |