Innovative DC-resistive read-out in silicon sensors: internal gain and signal sharing for future 4D tracking

• Published in: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) pp. 1 - 2
• Main Authors: Arcidiacono, R., Boscardin, M., Cartiglia, N., Vignali, M. Centis, Croci, T., Ferrero, M., Fondacci, A., Ali, O. Hammad, Lanteri, L., Losana, A., Menzio, L., Monaco, V., Morozzi, A., Moscatelli, F., Mulargia, R., Passeri, D., Paternoster, G., Siviero, F., Sola, V.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 04-11-2023
• Subjects: Micrometers; Semiconductor detectors; Semiconductor device measurement; Silicon; Solid modeling; Three-dimensional displays; Time measurement
• ISSN: 2577-0829
• DOI: 10.1109/NSSMICRTSD49126.2023.10338793

Recent developments in sensor design are opening the way to high resolution 4D-tracking detectors, able to measure concurrently position and time of passage of charged particles using the same sensitive device. The ongoing R&D path, based on the Low Gain Avalanche Diode (LGAD) technology, brings a new paradigm by introducing controlled signal sharing in the principles of operation of silicon sensors with the internal gain. The device under development is a thin LGAD with a resistive DC-coupled read-out (DC-coupled Resistive Silicon Detector - DC-RSD). The goal is to achieve a spatial resolution of a few micrometres using large pixels (150-200 micrometres), providing an excellent time resolution (~20-30 ps).The concept of DC-RSD has been finalized using an innovative mixed-mode approach to simulation: SPICE-based fast modeling to derive the sensor design parameters, followed by full 3D TCAD simulations of the sensor behaviour.This contribution reports the latest outcome of the simulations, which have been instrumental for the definition of the design technical implementation. This contribution also describes the characteristics of the first DC-RSD production at FBK, to be submitted in early summer, aimed at exploring multiple technological options and electrode layouts.Interesting information on the expected DC-RSD performance, extracted from recent experimental results obtained on AC-coupled resistive read-out sensors and on DC-RSD test structures, will be presented.