Optical and microwave properties of focused ion beam implanted Erbium ions in Y2SiO5 crystals

We present focused ion beam implantation as a prospective tool for realizing a patterned rare-earth spin-ensemble in a solid-state substrate. We demonstrate a successful implantation with 20% of luminescent ion activation for Erbium ions in Y 2 SiO 5 crystals.

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Bibliographic Details
Published in:	2015 Conference on Lasers and Electro-Optics (CLEO) pp. 1 - 2
Main Authors:	Kukharchyk, Nadezhda, Probst, Sebastian, Pal, Shovon, Kangwei Xia, Kolesov, Roman, Ludwig, Arne, Ustinov, Alexey V., Bushev, Pavel, Wieck, Andreas D.
Format:	Conference Proceeding
Language:	English
Published:	OSA 01-05-2015
Subjects:	Couplings Crystals Erbium Optical coupling Optical resonators Particle beam optics Temperature measurement
Online Access:	Get full text
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Description
Summary:	We present focused ion beam implantation as a prospective tool for realizing a patterned rare-earth spin-ensemble in a solid-state substrate. We demonstrate a successful implantation with 20% of luminescent ion activation for Erbium ions in Y 2 SiO 5 crystals.
ISSN:	2160-8989 2160-9004
DOI:	10.1364/CLEO_AT.2015.JW2A.21