Structural, microstructural and ferroelectric properties of lead-free Ca-doped BaTiO3 thin films

• Published in: Ferroelectrics Vol. 518; no. 1; pp. 118 - 123
• Main Authors: Sharma, Hakikat, Negi, N. S.
• Format: Journal Article
• Language: English
• Published: Philadelphia Taylor & Francis 03-10-2017; Taylor & Francis Ltd
• Subjects: AFM; Atomic force microscopes; Atomic force microscopy; Atomic structure; Barium titanates; current density; ferroelectric; Ferroelectric materials; Ferroelectricity; Lead; Lead free; Leakage current; Microscopes; Perovskite structure; Raman; Sol-gel; Sol-gel processes; Spin coating; Structural analysis; Thickness; Thin films; XRD
• ISSN: 0015-0193; 1563-5112
• DOI: 10.1080/00150193.2017.1360616

The lead-free BaTiO
3
(BT) and Ba
1-x
Ca
x
TiO
3
(0.10 ≤x ≤ 0.30) ferroelectric thin films were fabricated by sol-gel method using spin coating unit. The prepared thin films were characterized by X- ray diffractometer and Raman spectrometer for structural analysis. The XRD patterns confirmed the perovskite structure of thin films. Microstructural study has been carried out by atomic force microscope (AFM). The leakage current density increased on Ca substitution. Room temperature electric field dependent polarization has been studied by radiant multiferroic tester. Thickness of the thin films has been measured by cross-sectional FE-SEM, which is not included in the present article.