A compact, tethered E-band VNA reflectometer

It is shown in this paper that nonlinear-transmission-line (NLTL) technology enables compact millimeter-wave vector-network-analyzer (VNA) architectures with enhanced performance and flexibility. To this end, a compact, tethered, highly integrated, NLTL-based E-band reflectometer is described and re...

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Bibliographic Details
Published in:2016 IEEE MTT-S International Microwave Symposium (IMS) pp. 1 - 3
Main Authors: Roberts, T., Noujeim, K. M.
Format: Conference Proceeding
Language:English
Published: IEEE 01-05-2016
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Summary:It is shown in this paper that nonlinear-transmission-line (NLTL) technology enables compact millimeter-wave vector-network-analyzer (VNA) architectures with enhanced performance and flexibility. To this end, a compact, tethered, highly integrated, NLTL-based E-band reflectometer is described and results of its evaluation in one-and two-port configurations are shown, with special emphasis on raw performance, dynamic range, and measurement stability. The flexibility afforded by the resulting VNA promises to reduce measurement complexity and enhance efficiency in a variety of measurement scenarios.
DOI:10.1109/MWSYM.2016.7540153