NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

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Bibliographic Details
Published in:	2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) pp. 1 - 12
Main Authors:	Topper, Alyson D., Lauenstein, Jean-Marie, Wilcox, Edward P., Berg, Melanie D., Campola, Michael J., Casey, Megan C., Wyrwas, Edward J., O'Bryan, Martha V., Carstens, Thomas A., Fedele, Caroline M., Forney, James D., Kim, Hak S., Osheroff, Jason M., Phan, Anthony M., Chaiken, Max F., Cochran, Donna J., Pellish, Jonathan A., Majewicz, Peter J.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-11-2020
Subjects:	analog devices bipolar devices digital devices displacement damage dose FET flash memories flash memory FPGA Ions Lasers Logic gates NASA NASA goddard space flight center NASA space utilization optoelectronics Performance evaluation Protons radiation effects radiation effects test results radiation hardening (electronics) single event effects testing space vehicle electronics Testing total ionizing dose
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Abstract	Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.
AbstractList	Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.
Author	Wilcox, Edward P. Topper, Alyson D. Casey, Megan C. Cochran, Donna J. Fedele, Caroline M. Wyrwas, Edward J. Pellish, Jonathan A. Kim, Hak S. O'Bryan, Martha V. Chaiken, Max F. Campola, Michael J. Majewicz, Peter J. Osheroff, Jason M. Lauenstein, Jean-Marie Forney, James D. Berg, Melanie D. Carstens, Thomas A. Phan, Anthony M.
Author_xml	– sequence: 1 givenname: Alyson D. surname: Topper fullname: Topper, Alyson D. email: alyson.d.topper@nasa.gov organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 2 givenname: Jean-Marie surname: Lauenstein fullname: Lauenstein, Jean-Marie organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 3 givenname: Edward P. surname: Wilcox fullname: Wilcox, Edward P. organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 4 givenname: Melanie D. surname: Berg fullname: Berg, Melanie D. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 5 givenname: Michael J. surname: Campola fullname: Campola, Michael J. email: michael.j.campola@nasa.gov organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 6 givenname: Megan C. surname: Casey fullname: Casey, Megan C. organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 7 givenname: Edward J. surname: Wyrwas fullname: Wyrwas, Edward J. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 8 givenname: Martha V. surname: O'Bryan fullname: O'Bryan, Martha V. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 9 givenname: Thomas A. surname: Carstens fullname: Carstens, Thomas A. organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 10 givenname: Caroline M. surname: Fedele fullname: Fedele, Caroline M. organization: NASA Pathways Intern – sequence: 11 givenname: James D. surname: Forney fullname: Forney, James D. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 12 givenname: Hak S. surname: Kim fullname: Kim, Hak S. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 13 givenname: Jason M. surname: Osheroff fullname: Osheroff, Jason M. organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 14 givenname: Anthony M. surname: Phan fullname: Phan, Anthony M. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 15 givenname: Max F. surname: Chaiken fullname: Chaiken, Max F. email: max.f.chaiken@nasa.gov organization: NASA/GRC,Cleveland,OH,44135 – sequence: 16 givenname: Donna J. surname: Cochran fullname: Cochran, Donna J. organization: SSAI, work performed for NASA Goddard Space Flight Center, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 17 givenname: Jonathan A. surname: Pellish fullname: Pellish, Jonathan A. organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771 – sequence: 18 givenname: Peter J. surname: Majewicz fullname: Majewicz, Peter J. organization: NASA/GSFC, Code 561.4,Greenbelt,MD,USA,20771
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SubjectTerms	analog devices bipolar devices digital devices displacement damage dose FET flash memories flash memory FPGA Ions Lasers Logic gates NASA NASA goddard space flight center NASA space utilization optoelectronics Performance evaluation Protons radiation effects radiation effects test results radiation hardening (electronics) single event effects testing space vehicle electronics Testing total ionizing dose
Title	NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results
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