NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

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Bibliographic Details
Published in:	2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) pp. 1 - 12
Main Authors:	Topper, Alyson D., Lauenstein, Jean-Marie, Wilcox, Edward P., Berg, Melanie D., Campola, Michael J., Casey, Megan C., Wyrwas, Edward J., O'Bryan, Martha V., Carstens, Thomas A., Fedele, Caroline M., Forney, James D., Kim, Hak S., Osheroff, Jason M., Phan, Anthony M., Chaiken, Max F., Cochran, Donna J., Pellish, Jonathan A., Majewicz, Peter J.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-11-2020
Subjects:	analog devices bipolar devices digital devices displacement damage dose FET flash memories flash memory FPGA Ions Lasers Logic gates NASA NASA goddard space flight center NASA space utilization optoelectronics Performance evaluation Protons radiation effects radiation effects test results radiation hardening (electronics) single event effects testing space vehicle electronics Testing total ionizing dose
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Description
Summary:	Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.
DOI:	10.1109/REDW51883.2020.9325841