RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems

• Published in: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) pp. 388 - 393
• Main Authors: Jenihhin, M., Hamdioui, S., Reorda, M. Sonza, Krstic, M., Langendorfer, P., Sauer, C., Klotz, A., Huebner, M., Nolte, J., Vierhaus, H. T., Selimis, G., Alexandrescu, D., Taouil, M., Schrijen, G. J., Raik, J., Sterpone, L., Squillero, G., Dyka, Z.
• Format: Conference Proceeding
• Language: English
• Published: EDAA 01-03-2020
• Subjects: Automation; EDA tools; Europe; Fault tolerance; Fault tolerant systems; reliability; Reliability engineering; Security; test
• ISSN: 1558-1101
• DOI: 10.23919/DATE48585.2020.9116558

The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSCAITN project RESCUE is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies. The objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers. Notable interdisciplinary collaborative research results for the first halfperiod include novel approaches for test generation, soft-error and transient faults vulnerability analysis, cross-layer fault-tolerance and error-resilience, functional safety validation, reliability assessment and run-time management, HW security enhancement and initial implementation of these into holistic EDA tools.