Automatic Fault Tree Generation from Radiation-Induced Fault Models

The space environment raises several unique reliability issues for non-optical-based electronic systems for surviving radiation from cosmic rays, our Sun, or the trapped radiation belts. These radiation categories are total ionizing dose (TID), a cumulative degradation mechanism that may eventually...

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Bibliographic Details

Published in:	2020 Annual Reliability and Maintainability Symposium (RAMS) pp. 1 - 7
Main Authors:	Austin, Rebekah A., Mahadevan, Nagabhushan, Witulski, Arthur F., Karsai, Gabor, Sierawski, Brian D., Schrimpf, Ronald D., Reed, Robert A.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-01-2020
Subjects:	Analytical models Circuit faults COTS CubeSat Fault Models Fault trees Libraries Load modeling Radiation Hardness Assurance Reliability Reliability and Maintainability
Online Access:	Get full text
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