Automatic Fault Tree Generation from Radiation-Induced Fault Models

Automatic Fault Tree Generation from Radiation-Induced Fault Models

The space environment raises several unique reliability issues for non-optical-based electronic systems for surviving radiation from cosmic rays, our Sun, or the trapped radiation belts. These radiation categories are total ionizing dose (TID), a cumulative degradation mechanism that may eventually...

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Bibliographic Details
Published in:2020 Annual Reliability and Maintainability Symposium (RAMS) pp. 1 - 7
Main Authors: Austin, Rebekah A., Mahadevan, Nagabhushan, Witulski, Arthur F., Karsai, Gabor, Sierawski, Brian D., Schrimpf, Ronald D., Reed, Robert A.
Format: Conference Proceeding
Language:English
Published: IEEE 01-01-2020
Subjects:
Analytical models
Circuit faults
COTS
CubeSat
Fault Models
Fault trees
Libraries
Load modeling
Radiation Hardness Assurance
Reliability
Reliability and Maintainability
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Summary:The space environment raises several unique reliability issues for non-optical-based electronic systems for surviving radiation from cosmic rays, our Sun, or the trapped radiation belts. These radiation categories are total ionizing dose (TID), a cumulative degradation mechanism that may eventually lead to component failure, and single-event effects (SEE), random events in time that are either recoverable or permanent failures. Fault effects and degradation caused by these mechanisms can propagate through the system and cause system failure, even mission failure when not accounted for and mitigated.
ISSN:2577-0993
DOI:10.1109/RAMS48030.2020.9153630