Single Event Latchup Results for COTS Devices Used on SmallSat Missions

We present single event latchup (SEL) results for a variety of microelectronic devices frequently designated for SmallSat missions. The data presented is only a small representation of all the SEL tests performed in 2019.

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Bibliographic Details
Published in:	2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) pp. 1 - 4
Main Authors:	Vartanian, Sergeh, Irom, Farokh, Allen, Gregory R., Parker, Wilson P., O'Connor, Michael D.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-11-2020
Subjects:	artificial satellites CMOS integrated circuits COTS devices integrated circuit testing Ions Microcontrollers microelectronic devices Propulsion radiation hardening (electronics) Random access memory SEL tests Single event latchup single event latchup results SmallSat missions space vehicle electronics Temperature measurement Test facilities
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Description
Summary:	We present single event latchup (SEL) results for a variety of microelectronic devices frequently designated for SmallSat missions. The data presented is only a small representation of all the SEL tests performed in 2019.
DOI:	10.1109/REDW51883.2020.9325824