Multiple Probe Interactions in Near-field Imaging

Multiple Probe Interactions in Near-field Imaging

We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem

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Bibliographic Details
Published in:LEOS 2006 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society pp. 691 - 692
Main Authors: Carney, P.S., Sun, J., Schotland, J.C.
Format: Conference Proceeding
Language:English
Published: IEEE 01-10-2006
Subjects:
Apertures
Biomedical optical imaging
Inverse problems
Lighting
Optical imaging
Optical microscopy
Optical scattering
Probes
Spatial resolution
Spectroscopy
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Description
Summary:We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem
ISBN:9780780395565
0780395565
ISSN:1092-8081
2766-1733
DOI:10.1109/LEOS.2006.278901