Wear out effects in ESD characterization and testing

Wear out effects in ESD characterization and testing

Wear out effects resulting from multiple stresses may have significant impact on ESD characterization and testing. This is shown in examples of (vf-)TLP, HMM and CDM results on test structures and products. Wear out effects lead to lower failure levels and should be minimized to obtain the correct p...

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Bibliographic Details
Published in:2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) pp. 1 - 8
Main Authors: Smedes, Theo, Abessolo-Bidzo, Dolphin
Format: Conference Proceeding
Language:English
Published: EOS/ESD Association 01-09-2015
Subjects:
Degradation
Electrostatic discharges
Hidden Markov models
Metals
Qualifications
Silicides
Stress
Online Access:Get full text
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Description
Summary:Wear out effects resulting from multiple stresses may have significant impact on ESD characterization and testing. This is shown in examples of (vf-)TLP, HMM and CDM results on test structures and products. Wear out effects lead to lower failure levels and should be minimized to obtain the correct pass/fail levels.
ISSN:0739-5159
2164-9340
DOI:10.1109/EOSESD.2015.7314783