Characterization of bit transistors in a functional SRAM

Characterization of bit transistors in a functional SRAM

A direct bit transistor access (DBTA) scheme is proposed and implemented in 8 Mb SRAMpsilas at 65 nm and 45 nm nodes. It allows, for the first time, characterization of each bit transistor in a functional SRAM. It thus enables (a) collection of transistor data across bit arrays, (b) collection of ma...

Full description

Saved in:
Bibliographic Details
Published in:2008 IEEE Symposium on VLSI Circuits pp. 44 - 45
Main Authors: Xiaowei Deng, Wah Kit Loh, Pious, B., Houston, T.W., Liu, L., Bashar Khan, Corum, D.
Format: Conference Proceeding
Language:English
Published: IEEE 01-06-2008
Subjects:
Current measurement
Driver circuits
Logic gates
Niobium compounds
Random access memory
Transistors
Voltage measurement
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A direct bit transistor access (DBTA) scheme is proposed and implemented in 8 Mb SRAMpsilas at 65 nm and 45 nm nodes. It allows, for the first time, characterization of each bit transistor in a functional SRAM. It thus enables (a) collection of transistor data across bit arrays, (b) collection of massive data for statistical analysis such as on transistor mismatch and NBTI Vt drift, and (c) collection of data for fast failure analysis. Measured data are presented.
ISBN:1424418046
9781424418046
ISSN:2158-5601
2158-5636
DOI:10.1109/VLSIC.2008.4585945