A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.

Saved in:

Bibliographic Details
Published in:	Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 pp. 1 - 10
Main Authors:	Kuo-Hsuan Meng, Gerdemann, Alex, Miller, James W., Rosenbaum, Elyse
Format:	Conference Proceeding
Language:	English
Published:	ESD Association 01-09-2014
Subjects:	Electrostatic discharges Integrated circuit modeling Layout Manganese Resistors Robustness Stress
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

Description
Summary:	The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.
ISSN:	0739-5159 2164-9340