Implement TPS with ATML and NI TestStand

• Published in: 2010 3rd International Conference on Computer Science and Information Technology Vol. 7; pp. 538 - 541
• Main Authors: Fan Shuyi, Meng Chen, Jiang Huixia
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01-07-2010
• Subjects: ATML; ATS; Instruments; NI TestStand; Test Description; Three dimensional displays; Variable speed drives; XML
• ISBN: 9781424455379; 1424455375
• DOI: 10.1109/ICCSIT.2010.5564805

The Automatic Test Markup Language (ATML) is a documentation standard for automatic test information. ATML was born out of the thought that it is "the information" and a way to "communicate that information" may be the way to improve upon the inefficiencies of testing in both time and budget. ATML defines a collection of IEEE Standards and XML schema that represent automatic test related information (such as test description, test results, UUT description and instrument description) which will provide increased ATE system compatibility and Test Program Set (TPS) transportability. The two most adopted XML schemas in the ATML standard are Test Description (TD) and Test Results. Many organizations are expecting the adoption of ATML TD standards to reduce the development and maintenance costs of TPS and expecting the adoption of Test Results to facilitate sharing the test outcomes up and down the maintenance chain of product. This paper discusses how to translate ATML TD to National Instruments (NI) TestStand TPS with ATML TD TestStand translator. Finally, a test report which conformance to ATML standards is generated.