Built-in self-test of molecular electronics-based nanofabrics

• Published in: European Test Symposium (ETS'05) pp. 168 - 173
• Main Authors: Wang, Z., Chakrabarty, K.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2005
• Subjects: Built-in self-test; Chemical technology; Circuit faults; CMOS technology; Costs; Economic forecasting; Field programmable gate arrays; Nanotechnology; Self-assembly; Testing
• ISBN: 0769523412; 9780769523415
• ISSN: 1530-1877; 1558-1780
• DOI: 10.1109/ETS.2005.10

We propose a built-in self-test (BIST) procedure for nanofabrics based on chemically-assembled electronic nanotechnology. We also present a recovery procedure through which we can identify defect-free nanoblocks and switchblocks in the nanofabric under test. The proposed BIST and recovery procedures are based on the reconfiguration of the nanofabric to achieve complete fault coverage of different types of faults. We show that a large fraction of defect-free blocks can be recovered using a small number of BIST configurations. The proposed BIST procedure is well suited for regular and dense architectures that have high defect densities.