LIMSoft: automated tool for design and test integration of analog circuits

• Published in: Proceedings International Test Conference 1996. Test and Design Validity pp. 571 - 580
• Main Authors: Hamida, N.B., Saab, K., Marche, D., Kaminska, B., Quesnel, G.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 1996
• Subjects: Analog circuits; Analog integrated circuits; Automatic testing; Circuit analysis computing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Manufacturing processes; Process design
• ISBN: 9780780335417; 0780335414
• ISSN: 1089-3539; 2378-2250
• DOI: 10.1109/TEST.1996.557094

Integrating design and test presents a good challenge in today's analog circuit manufacturing process. Designs should be made according to the sensitivity of the output to all the components. Furthermore, sensitivity can be used to observe component deviation (soft faults) and hard faults from the output. This paper presents an automated sensitivity analysis tool, called LIMSoft, which offers the possibility of sensitivity computation and analysis in order to design fault-resistant circuits and generate test vectors for both soft and hard faults. Some applications for integrating test and design are also presented.