On applying non-classical defect models to automated diagnosis

On applying non-classical defect models to automated diagnosis

Automated fault diagnosis based on the stuck-at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focu...

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Bibliographic Details
Published in:Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) pp. 748 - 757
Main Authors: Saxena, J., Butler, K.M., Balachandran, H., Lavo, D.B., Chess, B., Larrabee, T., Ferguson, F.J.
Format: Conference Proceeding
Language:English
Published: IEEE 1998
Subjects:
Circuit faults
Debugging
Electron microscopy
Fault diagnosis
Instruments
Manufacturing industries
Monolithic integrated circuits
Optical microscopy
Silicon
System testing
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Summary:Automated fault diagnosis based on the stuck-at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine.
ISBN:9780780350939
0780350936
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1998.743256