Determination of the Avogadro constant from precision density measurements on a silicon sphere

Determination of the Avogadro constant from precision density measurements on a silicon sphere

Density measurements with relative uncertainty of 1/spl times/10/sup -7/ have been made on a highly polished 1 kg single crystal silicon sphere. The molar mass, crystal quality and lattice parameter have been measured elsewhere, enabling a determination of the Avogadro constant to be made. The purpo...

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Bibliographic Details
Published in:Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) pp. 184 - 185
Main Authors: Kenny, M.J., Walsh, C.J., Leistner, A.J., Fen, K., Giardini, W.J., Wielunski, L.S., Ward, B.R.
Format: Conference Proceeding
Language:English
Published: IEEE 2000
Subjects:
Atmospheric measurements
Atomic measurements
Density measurement
Fabrication
Laboratories
Lattices
Optical interferometry
Optical surface waves
Silicon
Wavelength measurement
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Summary:Density measurements with relative uncertainty of 1/spl times/10/sup -7/ have been made on a highly polished 1 kg single crystal silicon sphere. The molar mass, crystal quality and lattice parameter have been measured elsewhere, enabling a determination of the Avogadro constant to be made. The purpose is to obtain a definition of the kilogram in terms of a specific number of /sup 12/C atoms.
ISBN:0780357442
9780780357440
DOI:10.1109/CPEM.2000.850937