All-Directional Dual Pixel Auto Focus Technology in CMOS Image Sensors

• Published in: 2021 Symposium on VLSI Circuits pp. 1 - 2
• Main Authors: Shim, Eun Sub, Lee, Kyungho, Pyo, Junghyung, Choi, Wooseok, Yun, Jungbin, Jung, Taesub, Lee, Kyungduck, Kim, Seyoung, Lee, Chanhee, Baek, Seungki, Kim, Hyuncheol, Choi, Sungsoo, Yang, Junseok, Son, Kyoungmok, Choi, Jongwon, Park, Howoo, Kim, Bumsuk, Ahn, JungChak, Chang, Duckhyun
• Format: Conference Proceeding
• Language: English
• Published: JSAP 13-06-2021
• Subjects: CMOS image sensors; Diffusion tensor imaging; Image quality; Lenses; Very large scale integration
• ISSN: 2158-5636
• DOI: 10.23919/VLSICircuits52068.2021.9492472

We developed a dual pixel with accurate and all-directional auto focus (AF) performance in CMOS image sensor (CIS). The optimized in-pixel deep trench isolation (DTI) provided accurate AF data and good image quality in the entire image area and over whole visible wavelength range. Furthermore, the horizontal-vertical (HV) dual pixel with the slanted in-pixel DTI enabled the acquisition of all-directional AF information by the conventional dual pixel readout method. These technologies were demonstrated in 1.4μm dual pixel and will be applied to the further shrunken pixels.