Systematic development of a robust circuit-model technique for subwavelength imaging with wire-medium type lenses

• Published in: 2017 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting pp. 1953 - 1954
• Main Authors: Moreno, Gabriel, Forouzmand, Ali, Yakovlev, Alexander B., Silveirinha, Mario G., Hanson, George W.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01-07-2017
• Subjects: Graphene; Imaging; Integrated circuit modeling; Load modeling; local thickness-dependent permittivity; nonlocal homogenization; Permittivity; Slabs; Subwavelength imaging; wire medium; Wires
• ISSN: 1947-1491
• DOI: 10.1109/APUSNCURSINRSM.2017.8073019

Here, a general circuit model-based formalism is established to quantify the interaction of electromagnetic waves (both propagating and evanescent waves) with mushroom-type structures. A thickness-dependent local permittivity is exploited in order to characterize the isolated and bounded wire medium (WM) topologies which can take into account the spatial dispersion and the effect of boundaries. The obtained robust method can be a promising alternative for the previously developed nonlocal homogenization approach and it can also be useful to simplify the formulation for the near-field problems in particular subwavelength imaging applications. The proposed circuit model can accurately evaluate the amplification of the evanescent modes which is the physical mechanism behind the subwavelength imaging. The analytical results which are achieved in terms of the transmission response versus excited evanescent modes and the image profile demonstrate a good agreement between the local thickness-dependent and the nonlocal homogenization models.