Process variability influence on complementary organic circuits characterictics

Process variability influence on complementary organic circuits characterictics

This paper presents a study on the variability of N- and P-type organic transistors fabrication process and its consequences on organic circuits' electrical performance. Model cards corresponding to the measured devices are carried out and permit to simulate organic circuits. A NAND gate, made...

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Bibliographic Details
Published in:2013 IEEE International Conference of Electron Devices and Solid-state Circuits pp. 1 - 2
Main Authors: Guerin, Mathieu, Bergeret, Emmanuel, Benevent, Evangeline, Pannier, Philippe, Daami, Anis, Coppard, Romain
Format: Conference Proceeding
Language:English
Published: IEEE 01-06-2013
Subjects:
circuit
digital
Laser ablation
Logic gates
model card
Organic
process dispersion
Transistors
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Summary:This paper presents a study on the variability of N- and P-type organic transistors fabrication process and its consequences on organic circuits' electrical performance. Model cards corresponding to the measured devices are carried out and permit to simulate organic circuits. A NAND gate, made of four transistors, is simulated, manufactured and electrically characterized. Even though an important dispersion among the transistors electrical characteristics is observed, all measured NAND gates are functional.
DOI:10.1109/EDSSC.2013.6628069